Display apparatus and fabrication method and fabrication apparatus for the same
AssigneeSony Corporation
InventorsKatsuhide Uchino, Tetsuro Yamamoto
Life of this patent
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Abstract
A pixel array section includes a plurality of pixel circuits disposed in a matrix and each including a driving transistor, a storage capacitor, an electro-optical element, and a sampling transistor. Each pixel circuit includes a pixel divided into a plurality of divisional pixels for each of which an electro-optical element is provided, and a test transistor provided between the driving transistor and the electro-optical elements for carrying out on/off operations for specifying whether or not the electro-optical element is a dark spot element so that the electro-optical element of the dark spot can be specified. The number of the test transistors is smaller than the number of the divisional elements of the original one pixel.
Claims16
A display apparatus comprising:
- a pixel circuit including
- a storage capacitor configured to store information corresponding to an image signal,
- a sampling transistor configured to write the information corresponding to an image signal into the storage capacitor,
- a driving transistor configured to produce a driving current whose magnitude corresponds to a voltage stored in the storage capacitor,
- M electro-optical elements connected to an output terminal of the driving transistor, where M is an integer greater than 1, and
- N test transistors, where N is an integer less than M,
- wherein each of the N test transistors is configured to selectively control current flowing between a corresponding one of the M electro-optical elements and a current path to the output terminal of the driving transistor, and
- wherein at least one of the M electro-optical elements is not configured to have a corresponding test transistor that selectively controls current flowing between the at least one of the M electro-optical elements and a current path to the output terminal of the driving transistor.
A method of correcting dark spots of a pixel circuit, comprising:
- causing ones of N test transistors that are connected to M electro-optical elements that are included in the pixel circuit to be selectively turned off and on while driving current is produced by a driving transistor included in the pixel circuit and connected to the M electro-optical elements;
- detecting any of the M electro-optical elements that is a dark spot;
- and
- electrically isolating any of the M electro-optical elements that are detected as a dark spot,
- wherein M is an integer greater than 1 and N is an integer less than M,
- wherein each of the N test transistors is configured to selectively control current flowing between a corresponding one of the M electro-optical elements and a current path to the output terminal of the driving transistor, and
- wherein at least one of the M electro-optical elements does not have a corresponding test transistor that selectively controls current flowing between the at least one of the M electro-optical elements and a current path to the output terminal of the driving transistor.
Dependencies are inferred from the claim text.