Semiconductor device, and method of diagnosing abnormality of boosting circuit of semiconductor device
AssigneeLapis Semiconductor Co., Ltd.
InventorMasafumi Ban
Life of this patent
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AssigneeLapis Semiconductor Co., Ltd.
InventorMasafumi Ban
Estimating the term…
The battery monitoring IC is provided with the short circuiting switch that includes the switching element that shorts the input side and the output side of the boosting circuit that boosts the power supply voltage to the driving voltage, that can drive the MOS transistor within the buffer amplifier in the saturated region, and supplies the driving voltage as the driving voltage of the buffer amplifier. An abnormality of the boosting circuit can be diagnosed by comparing the output voltage, that is measured when the short circuiting switch is turned off and the driving voltage boosted by the boosting circuit is supplied to the buffer amplifier, and the output voltage, that is measured when the short circuiting switch is turned on and the power supply voltage is, without going through the boosting circuit, supplied as is to the buffer amplifier.
A semiconductor device comprising:
An assembled battery system that comprises a battery configured to include a plurality of battery cells connected in series and detects a voltage of each of the battery cells, the assembled battery system comprising:
A battery monitoring IC for detecting, in a battery that is configured to include a plurality of battery cells connected in series, a voltage of each of the battery cells, the battery monitoring IC comprising:
Dependencies are inferred from the claim text.