Testing vias formed in printed circuit boards
AssigneeJuniper Networks, Inc.
InventorDavid P. Chengson
Life of this patent
Estimating the term…
Abstract
A device provides a time domain reflectometry (TDR) or a vector network analyzer (VNA) test signal to a via test area provided on a printed circuit board (PCB), where the via test area includes vias and via stubs formed in the vias. The device also receives a reflected signal from each via in the via test area of the PCB, and compares the reflected signal from each via to a minimum impedance threshold. The device further provides, for display, an indication of passing for the PCB, when the reflected signals from the vias are greater than the minimum impedance threshold.
Claims20
A method implemented by a device, the method comprising:
- providing, by the device, a time domain reflectometry (TDR) or a vector network analyzer (VNA) test signal to a via test area provided on a printed circuit board (PCB);
- receiving, by the device, a reflected signal from each via in the via test area of the PCB;
- comparing, by the device, the reflected signal from each via to a minimum impedance threshold;
- and
- providing, by the device and for display, an indication of passing for the PCB, when the reflected signals from the vias are greater than the minimum impedance threshold.
A device, comprising:
- a memory to store a plurality of instructions;
- and
- a processor to execute instructions in the memory to:
- provide a time domain reflectometry (TDR) or a vector network analyzer (VNA) test signal to a via test area provided on a printed circuit board (PCB), where the via test area includes vias and via stubs formed in the vias,
- receive a reflected signal from each via in the via test area of the PCB,
- compare the reflected signal from each via to a minimum impedance threshold, and
- provide, for display, an indication of passing for the PCB, when the reflected signals from the vias are greater than the minimum impedance threshold.
One or more non-transitory computer-readable media storing instructions executable by one or more processors, the media storing one or more instructions for:
- providing a time domain reflectometry (TDR) or a vector network analyzer (VNA) test signal to a via test area provided on a substrate;
- receiving a reflected signal from each via in the via test area of the substrate;
- comparing the reflected signal from each via to a minimum impedance threshold;
- providing, for display, an indication of passing for the substrate or for a mechanism used to create via stubs for the vias, when the reflected signals from the vias are greater than the minimum impedance threshold;
- and
- providing, for display, an indication of failing for the substrate or for the mechanism used to create via stubs for the vias, when at least one of the reflected signals from the vias is less than the minimum impedance threshold.
Dependencies are inferred from the claim text.