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US 8,507,916 B2Granted
Thin film transistor substrate, LCD device including the same, and method for manufacturing thin film transistor substrate
AssigneeSharp Kabushiki Kaisha
InventorKatsunori Misaki
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Abstract
A source electrode and a drain electrode are formed by a stack of a titanium layer, a molybdenum nitride layer, an aluminum layer, and a molybdenum nitride layer, the titanium layer is formed by dry etching, and an oxide semiconductor layer is formed by performing annealing in an oxygen-containing atmosphere after formation of the source electrode and the drain electrode.
Claims12
A thin film transistor substrate, comprising:
- a base substrate;
- and
- a thin film transistor having a gate electrode provided on the base substrate, a gate insulating film provided so as to cover the gate electrode, a semiconductor layer comprised of an oxide semiconductor and provided on the gate insulating film so as to overlap the gate electrode, and a source electrode and a drain electrode which are provided on the gate insulating film so as to face each other on the semiconductor layer and so that a part of the source electrode and a part of the drain electrode are connected to the semiconductor layer, wherein
- the source electrode and the drain electrode have a stack of a first conductive layer, a second conductive layer, and a third conductive layer,
- the third conductive layer is comprised of a low resistance metal that causes a redox reaction with the oxide semiconductor,
- the first conductive layer directly contacts the semiconductor layer, is formed by dry etching, and is comprised of a refractory metal including a Group 4 metal element that is less likely to cause the redox reaction with the oxide semiconductor than the third conductive layer does, an alloy primarily containing the Group 4 metal element, or a nitride or oxide thereof,
- the second conductive layer is comprised of a refractory metal including a Group 5 or Group 6 metal element into which metal particles of the third conductive layer are less likely to diffuse than into the first conductive layer, an alloy primarily containing the Group 5 or Group 6 metal element, or a nitride or oxide thereof, and
- the semiconductor layer is formed by performing annealing in an oxygen-containing atmosphere after formation of the source electrode and the drain electrode.
5 more elements
Dependencies are inferred from the claim text.