Method of manufacturing photoelectric conversion device
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsFumito Isaka, Sho Kato, Koji Dairiki
Life of this patent
Estimating the term…
Loading patent…
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorsFumito Isaka, Sho Kato, Koji Dairiki
Estimating the term…
A fragile layer is formed in a region at a depth of less than 1000 nm from one surface of a single crystal semiconductor substrate, and a first impurity semiconductor layer and a first electrode are formed at the one surface side. After bonding the first electrode and a supporting substrate, the single crystal semiconductor substrate is separated using the fragile layer or the vicinity as a separation plane, thereby forming a first single crystal semiconductor layer over the supporting substrate. An amorphous semiconductor layer is formed on the first single crystal semiconductor layer, and a second single crystal semiconductor layer is formed by heat treatment for solid phase growth of the amorphous semiconductor layer. A second impurity semiconductor layer having a conductivity type opposite to that of the first impurity semiconductor layer and a second electrode are formed over the second single crystal semiconductor layer.
A method of manufacturing a photoelectric conversion device, comprising the steps of:
A method of manufacturing a photoelectric conversion device, comprising the steps of:
A method of manufacturing a photoelectric conversion device, comprising the steps of:
A method of manufacturing a photoelectric conversion device, comprising the steps of:
Dependencies are inferred from the claim text.