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AssigneeNippon Steel & Sumitomo Metal Corporation
InventorsJunichi Nakagawa, Tadayuki Ito, Tetsuo Nishiyama, Masahiro Doki, Kozo Saito, Belal Gharaibeh, Keng Hoo Chuah, Ahmad Salaimeh, Masahiro Yamamoto, Tomoya Takeuchi, Kazufumi Ito, Huaxiong Huang, Sean C. Bohun
Estimating the term…
A defect on the surface or in the surface layer of a moving material can be detected by using a method comprising steps of: heating the surface of the material, obtaining thermal image data of the surface of the material using an infrared thermography camera while the surface of the material is being heated up at the heating step or being cooled down after heating, and detecting the defect by calculating Laplacian with respect to temperature of the surface represented by the thermal image data. When the thermal image data is obtained while the material is being heated up, a heating device and the camera is arranged so that thermal energy emitted from the heating device is reflected by the material to come into the camera.
A method for detecting a defect both on the surface and in the surface layer of a material, comprising the steps of:
A method for detecting a defect both on the surface and in the surface layer of a material, comprising the steps of:
A method for detecting a defect both on the surface and in the surface layer of a material, comprising the steps of:
A system for detecting a defect both on the surface and in the surface layer of a material comprising:
A system for detecting a defect both on the surface and in the surface layer of a material comprising:
A system for detecting a defect both on the surface and in the surface layer of a material comprising:
Dependencies are inferred from the claim text.