System and method for data recovery in a solid state storage device
AssigneeWestern Digital Technologies, Inc.
InventorRobert L. Horn
Life of this patent
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AssigneeWestern Digital Technologies, Inc.
InventorRobert L. Horn
Estimating the term…
Embodiments of solid-state storage system are provided herein include data recovery mechanism to recover data upon detection of a read error (e.g., an uncorrectable ECC error) in a storage element such as a page. In various embodiments, the system is configured to determine optimal reference voltage value(s) by evaluating the reference voltage value(s) of page(s) that are related to the page where the failure occurred. The related page(a) may include a page that is paired with the initial page where the failure occurred (e.g., the paired pages reside in a common memory cell), or a neighboring page that is physically near the page where the initial page, and/or a paired page of the neighboring page. In another embodiment, the system is configured to perform a time-limited search function to attempt to determine optimal reference voltage values through an iterative process that adjusts voltage values in a progression to determine a set of values that can retrieve the data.
In a storage subsystem comprising a non-volatile memory array that uses programmable voltage reference values to determine states of memory cells, a method for selecting voltage reference values for performing memory read operations, the method comprising:
A storage subsystem comprising:
In a storage subsystem comprising a non-volatile memory array that uses programmable voltage reference values to determine states of memory cells, a method for selecting voltage reference values for performing memory read operations, the method comprising:
Dependencies are inferred from the claim text.