Parametric yield improvement flow incorporating sigma to target distance
AssigneeCadence Design Systems, Inc.
InventorsHongzhou Liu, Hui Zhang
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AssigneeCadence Design Systems, Inc.
InventorsHongzhou Liu, Hui Zhang
Estimating the term…
Techniques are presented for improving parametric yield. As part of an automatic sizing process for a circuit, one set of techniques receives a target value for a performance goal and then optimizes, with respect to the number of standard deviations, the distance by which the mean value of a distribution of the performance goal differs from the target value. In a second set of techniques, as part of an automatic sizing process during a circuit design process, the operation of the circuit is simulated to determine the distribution of a performance goal for a first design point. It is then determined whether a second design point is sufficiently close to the first design point and, if so, the simulation for the first design point is used for evaluating the second design point in an optimization process.
A method for optimizing a circuit design, the method comprising:
A computer program product for a circuit design process, including a non-transitory computer-readable storage medium storing executable program code which, when executed by a computer, performs a method comprising:
In a circuit design process, a method comprising:
A computer program product for a circuit design process, including a non-transitory computer-readable storage medium storing executable program code which, when executed by a computer, performs a method comprising performing an automatic sizing process to find a size value for a circuit to meet a specification, including:
A system for a design process of an integrated circuit, comprising:
A system for a design process of an integrated circuit, comprising:
Dependencies are inferred from the claim text.