Microscope system and method
AssigneeHamamatsu Photonics K.K.
InventorJohn R. Maddison
Life of this patent
Estimating the term…
Abstract
A method for determining a position of an area of an object within the complete object, wherein the image of the area of the object is contained within a field of view of a microscope. The method comprises acquiring high magnification image data representing an image of the field of view of the microscope, typically from a digital camera attached to the microscope; processing the high magnification image data to reduce the resolution thereof; comparing the processed high magnification image data with portions of the low magnification image data, and determining said position based on the results of said comparison.
Claims14
A method for determining a position of an area of an object, the method comprising the steps of:
- storing high magnification image data representing an image of a part of the object and low magnification image data representing the object;
- processing the high magnification image data to reduce the resolution thereof;
- comparing the processed high magnification image data with portions of the low magnification image data;
- and
- determining said position based on the results of said comparison.
An apparatus for determining a position of an object, the apparatus comprising:
- storage memory configured to store high magnification image data representing an image of an area of a part of the object and to store low magnification image data representing the object;
- and
- a processor configured to process the high magnification image data to reduce the resolution thereof, to compare the processed high magnification image data with portions of the low magnification image data, and to determine said position based on the results of said comparison.
Dependencies are inferred from the claim text.