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US 8,477,904 B2Granted
X-ray diffraction and computed tomography
AssigneePANalytical B.V.
InventorGabriel Blaj
Life of this patent
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Abstract
An imaging system combines CT and XRD measurements, both measuring the XRD diffraction and the absorption as a function of energy. A goniometer 2, source 4 and two dimensional detector 10 may be used. Embodiments use relatively soft X-rays in the 5-25 keV range. An integrated mounting unit to mount the sample 8 close to detector 10 is also described.
Claims14
A dual mode X-ray diffraction and computed tomography imaging system, comprising:
- an X-ray source for emitting an X-ray beam;
- a two-dimensional X-ray detector;
- a sample position;
- a goniometer for positioning the X-ray source, X-ray detector and a sample at the sample position relative to one another;
- and
- a computer arranged to process the input from the 2D detector and output information about the sample based on the input from the 2D detector and the relative positions of X-ray source, X-ray detector and sample;
- wherein the computer positions the X-ray source, X-ray detector and sample to operate in an X-ray diffraction, XRD, mode carrying out angle dispersive X-ray diffraction on the sample by measuring the X-ray diffraction as a function of diffraction angle 2θ using the X-ray detector;
- and
- the computer positions the X-ray source, X-ray detector and sample to operate in a computed tomography, CT, mode to measure absorption of a sample as a function of position across the sample with the two-dimensional X-ray detector;
- wherein the imaging system operates in dual XRD mode and CT mode;
- and
- wherein the X-ray source is a source that emits X-rays having at least 30% of the total emitted X-ray intensity in at least one X-ray line in an energy band in the range 4.5 keV to 25 keV.
9 more elements
A method of operating an imaging system, comprising:
- positioning an X-ray source, X-ray detector and a sample at a sample position relative to one another;
- emitting an X-ray beam from the X-ray source towards the sample;
- detecting the beam after interaction with a sample using a two-dimensional X-ray detector;
- the method including processing the input from the 2D detector and output information about the sample based on the input from the 2D detector and the relative positions of X-ray source, X-ray detector and sample;
- and
- operating the imaging system in an X-ray diffraction, XRD, mode carrying out angle dispersive X-ray diffraction on the sample by measuring the X-ray diffraction as a function of diffraction angle 2θ using the X-ray detector;
- and
- operating the imaging system in a computed tomography, CT, mode measuring absorption of a sample as a function of position across the sample with the two-dimensional X-ray detector;
- wherein the imaging system is operated in dual XRD mode and CT mode;
- and
- wherein the X-ray source is a source that emits X-rays having at least 30% of the total emitted X-ray intensity in at least one X-ray line in an energy band in the range 4.5 keV to 25 keV.
8 more elements
Dependencies are inferred from the claim text.