Fuse circuit and semiconductor device having the same
AssigneeSamsung Electronics Co., Ltd.
InventorsSang-Seok Kang, Sang-Man Byun, Jae-Hoon Joo
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AssigneeSamsung Electronics Co., Ltd.
InventorsSang-Seok Kang, Sang-Man Byun, Jae-Hoon Joo
Estimating the term…
Provided is a fuse circuit capable of selectively using a power supply voltage for a logic operation according to an operation mode. The fuse circuit includes a mode generating circuit, a power supply voltage selection circuit, and at least one fuse unit. The mode generating circuit generates a plurality of mode signals. The power supply voltage selection circuit selects one out of a plurality of power supply voltages in response to the plurality of mode signals and outputs the selected power supply voltage to a first node. Each of the fuse units is coupled between the first node and a ground voltage and uses the selected power supply voltage as a power supply voltage for a logic operation. Thus, a semiconductor device including the fuse circuit may accurately test a connection state of a fuse.
A fuse circuit, comprising:
A semiconductor memory device, comprising:
A semiconductor memory device, comprising:
A semiconductor device, comprising:
Dependencies are inferred from the claim text.