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US 8,477,308 B1Granted
Polarized, specular reflectometer apparatus
AssigneeThe United States of America as represented by the Secretary of the Navy
InventorJames Joseph Haycraft
Life of this patent
Estimating the term…
Abstract
An apparatus and method for use on precision refractive index experiments that are performed on individual faces of single crystals or liquid surfaces of material using specific wavelengths of light. The process is used to measure the major and minor axes of the optical indicatrix of a single crystal of material at a very specific wavelength. This process is repeated for each crystal face in order to form a complete picture of the refractive index for the sample.
Claims17
An apparatus, comprising:
- a device that holds and/or suspends a sample in position to be analyzed, and a rotating device, wherein said sample can be moved and rotated into a stationary position;
- an adjustable source that produces light;
- an optical chopper, wherein said light is directed through said chopper, wherein said light exiting from said chopper provides a signal reference for experimentation;
- at least one mirror that directs light and aligns said light with said sample;
- a first iris and a second iris;
- a first polarizer and/or polarization device;
- and a second polarizer and/or polarization device;
- a first lens, a second lens and a third lens, wherein said light is directed through said first iris, said first polarizer and/or polarization device, and said first lens;
- a beam sampling device, wherein said device reflects a small portion of said light towards said sample, wherein said light reflects off said sample and through said second lens, said second polarizer and/or polarization device, said second iris and said third lens;
- a visualization device, wherein said light is directed through said visualization device;
- a data collection system;
- and
- a light sensing detector and a photomultiplier power supply, wherein after data is collected, light impacts said light sensing detector and said photomultiplier power supply energizes said light sensing detector creating a current signal.
10 more elements
A method for measuring surface reflectivity of a crystalline sample, comprising:
- producing light;
- directing said light through an optical chopper, modulating said light by said chopper, wherein said modulated light from said chopper provides a referencing signal;
- aligning said modulated light by mirror(s) with the sample and collection optics;
- directing said light through a first iris, a first polarizer and/or polarization device, a first lens;
- reflecting a small portion of said light toward said crystalline sample by a glass pick-off;
- mounting said crystalline sample on a device that holds and/or suspends said crystalline sample in a position to be analyzed, and a rotating device, wherein said crystalline sample can be moved and rotated into a stationary position;
- rotating said device that holds and/or suspends said crystalline sample to place said crystalline sample in a desired stationary position for analyzing;
- directing said light to reflect off of said crystalline sample;
- directing said light through a first lens, a second polarizer and/or polarization device, a second iris, and a second lens;
- directing said light through a microscope assembly
- observing said light through said microscope assembly;
- collecting data from findings of observing said light through said microscope assembly;
- impacting said light onto a photomultiplier tube or other suitable detector;
- energizing said light/photomultiplier tube by said photomultiplier power supply which alters said light to a current signal;
- channeling said current signal to a pre-amplifier and converting said current signal into a voltage signal and amplifying said voltage signal;
- channeling said amplified voltage signal to an optional digital locking amplifier and recording said amplified voltage signal;
- and
- channeling said amplified voltage signal to a digital oscilloscope and monitoring the modulated signal.
15 more elements
Dependencies are inferred from the claim text.