Electronic device with power tester
AssigneeSamsung Electronics Co., Ltd.
InventorsGunok Jung, Ukrae Cho, Yongjin Yoon, Donggyu Lee
Life of this patent
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Abstract
An electronic device includes an internal device and a voltage tester. The internal device includes a power supply source input terminal. The voltage tester supplies one of first and second power supply source voltages to the power supply source input terminal of the internal device, in response to a test signal. The first and second power supply source voltages have different voltage levels. The first power supply source voltage has a voltage level within a normal range required for normal operations of the internal device. The second power supply source voltage has an abnormal voltage level outside the normal range.
Claims19
An electronic device, comprising:
- an internal device comprising a power supply source input terminal;
- and
- a voltage tester supplying a first power supply source voltage to the power supply source input terminal of the internal device in response to a first switching signal, and a second power supply source voltage to the power supply source input terminal of the internal device in response to a second switching signal,
- wherein the first and second power supply source voltages have different voltage levels, and the first and second power supply voltages have constant values respectively,
- wherein the first and second switching signals are supplied in response to a test signal, and
- wherein values of the first and second switching signals are different from each other.
A central processing unit, comprising:
- an internal device comprising a signal input terminal;
- and
- a tester supplying a first voltage to the signal input terminal in response to a first switching signal, a second voltage to the signal input terminal in response to a second switching signal, and a third voltage to the signal input terminal in response to a third switching signal,
- wherein the first, second, and third voltages have different voltage levels,
- wherein the first, the second, and the third voltages have constant values respectively,
- wherein the first switching signal, the second switching signal, and the third switching signal are supplied in response to a test signal,
- wherein values of the first switching signal and the second switching signal are different from each other, and
- wherein the internal device and the tester are disposed on a single chip.
An electronic device, comprising:
- an internal device comprising a signal input terminal;
- a voltage tester supplying a first voltage to the signal input terminal in response to a first switching signal, a second voltage to the signal input terminal in response to a second switching signal, and a ground voltage to the signal input terminal in response to a third switching signal;
- a first switch connected between the first power supply voltage and the signal input terminal;
- a second switch connected between the second power supply voltage and the signal input terminal;
- and
- a third switch connected between the ground voltage and the signal input terminal,
- wherein the first and second power supply voltages have different voltage levels that are higher than the ground voltage,
- wherein the first and second voltages have constant values respectively,
- wherein the first, second, and third switching signals are supplied in response to a test signal, and
- wherein values of the first and second switching signals are different from each other.
Dependencies are inferred from the claim text.