Nonvolatile semiconductor memory device and method of manufacturing the same
AssigneeKabushiki Kaisha Toshiba
InventorKen Komiya
Life of this patent
Estimating the term…
Loading patent…
AssigneeKabushiki Kaisha Toshiba
InventorKen Komiya
Estimating the term…
A nonvolatile semiconductor memory device comprises: element isolation insulating films formed in a semiconductor substrate in a first direction; and element regions formed in a region sandwiched by the element isolation insulating film, with MONOS type memory cells. The MONOS type memory cell comprises: a tunnel insulating film disposed on the element region; a charge storage film disposed continuously on the element regions and the element isolation insulating films. The charge storage film comprises: a charge film disposed on the element region and having a certain charge trapping characteristic; and a degraded charge film disposed on the element isolation insulating film and having a charge trapping characteristic inferior to that of the charge film. The degraded charge film has a length of an upper surface thereof set shorter than a length of a lower surface thereof in a cross-section along the first direction.
A nonvolatile semiconductor memory device, comprising:
Dependencies are inferred from the claim text.