Compact high precision adjustable beam defining aperture
AssigneeThe Regents of the University of California
InventorsSimon A. Morton, Jeffrey Dickert
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Abstract
The present invention provides an adjustable aperture for limiting the dimension of a beam of energy. In an exemplary embodiment, the aperture includes (1) at least one piezoelectric bender, where a fixed end of the bender is attached to a common support structure via a first attachment and where a movable end of the bender is movable in response to an actuating voltage applied to the bender and (2) at least one blade attached to the movable end of the bender via a second attachment such that the blade is capable of impinging upon the beam. In an exemplary embodiment, the beam of energy is electromagnetic radiation. In an exemplary embodiment, the beam of energy is X-rays.
Claims24
An adjustable aperture for controlling the dimensions of a beam of energy comprising:
- at least one piezoelectric bender, wherein a fixed end of the bender is attached to a common support structure via a first attachment and wherein a movable end of the bender is movable in response to an actuating voltage applied to the bender;
- and
- at least one blade attached to the movable end of the bender via a second attachment such that the blade is capable of impinging upon the beam.
An adjustable aperture for limiting the dimension of a beam of energy comprising at least one piezoelectric bender, wherein a fixed end of the bender is attached to a common support structure via a first attachment and wherein a movable end of the bender is movable in response to an actuating voltage applied to the bender, thereby being able to impinge upon the beam.
An adjustable aperture for limiting the dimension of a beam of particles comprising:
- at least one piezoelectric bender, wherein a fixed end of the bender is attached to a common support structure via a first attachment and wherein a movable end of the bender is movable in response to an actuating voltage applied to the bender;
- and
- at least one blade attached to the movable end of the bender via a second attachment such that the blade is capable of impinging upon the beam.
An adjustable aperture for reducing the dimension of a beam of particles comprising at least one piezoelectric bender, wherein a fixed end of the bender is attached to a common support structure via a first attachment and wherein a movable end of the bender is movable in response to an actuating voltage applied to the bender, thereby being able to impinge upon the beam.
Dependencies are inferred from the claim text.