Identifying an atomic element using an integrated circuit
AssigneeXilinx, Inc.
InventorsJoseph J. Fabula, Austin H. Lesea, Raymond J. Matteis
Life of this patent
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Abstract
Systems and methods are provided for identifying an atomic element in proximity to an integrated circuit. Trace amounts of a contaminant are identifiable. The atomic element is exposed to neutron radiation to convert a portion of the atomic element into a radioactive isotope of the atomic element. Upsets are measured for the binary states of the memory cells of the integrated circuit during a time period following the exposure to the neutron radiation. The atomic element is identified from the upsets of the binary states of the memory cells of the integrated circuit.
Claims20
A method for identifying an atomic element in proximity to an integrated circuit, the method comprising:
- exposing the atomic element in proximity to the integrated circuit to neutron radiation, wherein the exposing includes converting a portion of the atomic element into a radioactive isotope of the atomic element;
- measuring a plurality of upsets of binary states of a plurality of memory cells of the integrated circuit during a time period following the exposing of the atomic element to the neutron radiation;
- and
- identifying the atomic element from the upsets of the binary states of the memory cells of the integrated circuit.
A system for identifying an atomic element, comprising:
- an integrated circuit including the atomic element and a plurality of memory cells each having a binary state;
- a generator of neutrons for converting a portion of the atomic element into a radioactive isotope of the atomic element, wherein a byproduct from radioactive decay of the radioactive isotope causes a plurality of upsets of the binary states of the memory cells;
- and
- an analyzer coupled to the integrated circuit for identifying the atomic element in response to the upsets of the binary states of the memory cells.
A system for identifying an atomic element in proximity to an integrated circuit, the system comprising:
- means for exposing the atomic element in proximity to the integrated circuit to neutron radiation which converts a portion of the atomic element into a radioactive isotope of the atomic element;
- means for measuring a plurality of upsets of binary states of a plurality of memory cells of the integrated circuit during a time period following the exposing of the atomic element to the neutron radiation;
- and
- means for identifying the atomic element from the upsets of the binary states of the memory cells of the integrated circuit.
Dependencies are inferred from the claim text.