Back to results
US 8,475,923 B2Granted
Heat transfer film, semiconductor device, and electronic apparatus
AssigneeFurukawa Electric Co., Ltd.
InventorsMasako Katayama, Hidemichi Fujiwara
Life of this patent
Estimating the term…
Abstract
A heat transfer film includes a heat transfer layer formed of a first constituent material containing C (carbon) for transferring heat in an in-plane direction thereof and a layer thickness direction thereof; and a strain relaxation layer formed of a second constituent material and laminated on the heat transfer layer for relaxing a strain in the heat transfer layer. The first constituent material includes a graphite, and the second constituent material includes an amorphous material.
Claims7
A heat transfer film, comprising:
- a first heat transfer layer laminated on a substrate, said first heat transfer layer being formed of a first constituent material containing C (carbon) for transferring heat in an in-plane direction thereof and a layer thickness direction thereof;
- a first strain relaxation layer formed of a second constituent material and laminated on the first heat transfer layer;
- a second heat transfer layer formed of the first constituent material and laminated on the first strain relaxation layer;
- and
- a second strain relaxation layer formed of the second constituent material and laminated on the second heat transfer layer for relaxing a strain in the second heat transfer layer,
- wherein said second heat transfer layer has a layer thickness d and said second strain relaxation layer has a layer thickness t both within a range of equal to or greater than 1 nm and equal to or smaller than 20 nm, and
- said first constituent material includes a graphite and said second constituent material includes one of an amorphous Si, an amorphous Ge, an amorphous SiGe, an amorphous SiO2, an amorphous SiOx, and an amorphous TiO2.
4 more elements
Dependencies are inferred from the claim text.