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US 8,474,356 B2Granted
Machine tool monitoring device
AssigneeRobert Bosch GmbH
InventorsGeorg Stellmann, Sebastian Jackisch
Life of this patent
Estimating the term…
Abstract
A machine tool monitoring device having a detection unit, which is configured to detect the presence of a material type in a machine tool work area by spectral analysis of a radiation. The detection unit has a sensor unit having at least one sensitivity region for detecting radiation in a wavelength range that is situated at least partially in the infrared spectrum.
Claims10
A machine tool monitoring device, comprising:
- a sensor unit;
- a detection unit to detect a presence of a material type in a machine tool work area by spectral analysis of a radiation;
- and
- an evaluation arrangement in the detection unit configured to detect the presence of the material type based on a ratio of at least two measured intensities of radiation, which are respectively associated with a radiation component in a different wavelength range;
- wherein the detection unit has the sensor unit, and the sensor unit has a plurality of sensitivity regions for measuring intensities of radiation at different wavelengths including at least one first sensitivity region for detecting radiation in a first wavelength range that is situated at least partially in the infrared spectrum and at least one second sensitivity region for detecting radiation in a second wavelength range.
2 more elements
A cutting machine tool, comprising:
- a machine tool monitoring device, including:
- a sensor unit;
- a detection unit to detect a presence of a material type in a machine tool work area by spectral analysis of a radiation;
- and
- an evaluation arrangement in the detection unit configured to detect the presence of the material type based on a ratio of at least two measured intensities of radiation, which are respectively associated with a radiation component in a different wavelength range;
- wherein the detection unit has the sensor unit, and the sensor unit has a plurality of sensitivity regions for measuring intensities of radiation at different wavelengths including at least one first sensitivity region for detecting radiation in a first wavelength range that is situated at least partially in the infrared spectrum and at least one second sensitivity region for detecting radiation in a second wavelength range.
3 more elements
Dependencies are inferred from the claim text.