Methods and apparatus for testing and integration of modules within an electronic device

An electronic apparatus adapted to perform multivariate analysis of at least one operational function, the apparatus comprising:

• at least two wireless interfaces;
• a module, the module preforms the at least one operational function;
• a user interface;
• a processing device in operative communication with the module and the user interface;
• and
• a computer readable apparatus in data communication with the processing device, the computer readable apparatus comprising media having a computer program with a plurality of instructions which, when executed on the processing device:
• enable at least two substantially separate test processes associated with at least two wireless interfaces respectively, each of the at least two test processes adapted to interface with portions of the module;
• activate the at least two test processes for the at least two wireless interfaces via the module;
• and
• present output generated by at least one activated test process of the at least two test processes within the user interface to test for performance degradation of at least one wireless interface in response to the activated at least two test processes.

A method for debugging a converged electronic device comprising a plurality of wireless interfaces, the method comprising:

• initiating at least two substantially separate test processes, each of the at least two test processes configured to interface to at least two respective wireless interfaces selected from the plurality of wireless interfaces;
• placing the at least two test processes in data communication with the at least two corresponding wireless interfaces, respectively;
• and
• presenting the at least two test processes within a user interface simultaneously;
• wherein the at least two test processes are configured to test for co-existence artifacts resulting from operation of the at least two corresponding wireless interfaces.