Gas sampling device
AssigneeAp2E
InventorsLucien Lonigro, Pierre Cholat
Life of this patent
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Abstract
The invention relates to a gas sampling device comprising a probe for sampling gas, an exploiting device for exploiting the gases sampled, a pipe for transmitting the gases sampled by the probe to the exploiting device, and means for lowering the pressure of the gases sampled in the pipe, to lower the dew point of the gases sampled, the means for lowering the pressure comprising an expansion nozzle arranged in the probe and communicating with the pipe, and a suction device for sucking the gases sampled in the pipe through the exploiting device. Application of the invention to the analysis of hot gases loaded with water vapor.
Claims15
A method of sampling gases comprising:
- sampling gases by a probe,
- transmitting all and only the sampled gases by the probe to a gas exploiting device through a pipe connecting the probe to the exploiting device, and
- lowering the pressure of the sampled gases in the pipe and the exploiting device, to lower the dew point of the sampled gases therein to a value lower than the temperature of the pipe and the exploiting device, lowering the pressure of the sampled gases being performed by sucking the sampled gases through an expansion nozzle arranged in the probe, and by sucking the sampled gases in the pipe and in the exploiting device by means of a sucking source connected to the exploiting device downstream from the exploiting device.
A device for sampling gases comprising:
- a probe for sampling gases,
- an exploiting device for exploiting the sampled gases,
- a pipe connecting the probe to the exploiting device, for transmitting all and only the sampled gases from by the probe to the exploiting device,
- an expansion nozzle arranged in the probe and communicating with the pipe, and
- a suction source connected to the exploiting device downstream from the exploiting device, for sucking the sampled gases in the pipe through the exploiting device, the expansion nozzle and the suction device being configured to lower the pressure of the gases sampled in the pipe, to lower the dew point of the sampled gases, below the temperature of the pipe and the exploiting device.
Dependencies are inferred from the claim text.