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US 8,448,261 B2Granted
Mode synthesizing atomic force microscopy and mode-synthesizing sensing
AssigneesUniversity of Tennessee Research Foundation, UT-Battelle, LLC
InventorsAli Passian, Thomas George Thundat, Laurene Tetard
Life of this patent
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Abstract
A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling.
Claims27
An analysis system comprising:
- a sample;
- a first excitation source that applies to a sample a first set of energies at a first set of frequencies;
- a second excitation source, independent of said first excitation source, that applies a second set of energies at a second set of frequencies to a probe, wherein said first set of energies and said second set of energies are simultaneously applied to said sample and said probe, respectively, and form a multi-mode coupling effect;
- and
- a detector that detects dynamics of said probe from which an effect of said multi-mode coupling effect can be obtained.
2 more elements
A method of analyzing a sample comprising:
- applying a first set of energies at a first set of frequencies to a sample;
- applying, simultaneously with said applying said first set of energies, a second set of energies at a second set of frequencies to a probe, wherein said first set of energies and said second set of energies form a multi-mode coupling;
- and
- detecting an effect of said multi-mode coupling.
1 more element
An analysis system comprising:
- a first excitation source that applies to a sample a first set of energies at a first set of frequencies;
- a second excitation source, independent of said first excitation source, that applies a second set of energies at a second set of frequencies to said sample, wherein said first set of energies and said second set of energies are simultaneously applied to said sample, and form a multi-mode coupling;
- a probe that contacts said sample;
- a detector that detects dynamics of said probe from which an effect of said multi-mode coupling can be obtained.
1 more element
An analysis system comprising:
- a first excitation source that applies to a sample a first set of energies at a first set of frequencies;
- a second excitation source, independent of said first excitation source, that applies a second set of energies at a second set of frequencies to said sample, wherein said first set of energies and said second set of energies are simultaneously applied to said sample, and form a multi-mode coupling;
- a probe that contacts said sample;
- a detector that detects dynamics of said probe from which an effect of said multi-mode coupling can be obtained;
- wherein said first excitation source is a first electromagnetic energy source that applies first electromagnetic fields to said sample, and wherein said second excitation source is a second electromagnetic energy source that applies second electromagnetic fields to said sample.
2 more elements
A method of analyzing a sample comprising:
- applying a first set of energies at a first set of frequencies to a sample;
- applying simultaneously with said applying said first set of energies a second set of energies at a second set of frequencies to said sample, wherein said first set of energies and said second set of energies form a multi-mode coupling;
- and
- detecting an effect of said multi-mode coupling effect via a probe that contacts said sample.
1 more element
A method of analyzing a sample comprising:
- applying a first set of energies at a first set of frequencies to a sample;
- applying simultaneously with said applying said first set of energies a second set of energies at a second set of frequencies to said sample, wherein said first set of energies and said second set of energies form a multi-mode coupling;
- and
- detecting an effect of said multi-mode coupling effect via a probe that contacts said sample;
- wherein said first set of energies are first electromagnetic energies and said second set of energies are second electromagnetic energies.
2 more elements
Dependencies are inferred from the claim text.