Translating a user design in a configurable IC for debugging the user design
AssigneeTabula, Inc.
InventorsBrad Hutchings, Andrew Caldwell, Steven Teig
Life of this patent
Estimating the term…
Abstract
Some embodiments provide a method of monitoring the implementation of a user design in a configurable integrated circuit (IC). The method receives a user design for an IC and optimizes the user design to produce a second IC design. The optimization results in the elimination of circuit element(s). The method defines the second IC design for the configurable IC and generates output data for the eliminated circuit element(s) to allow for monitoring the user design.
Claims16
A method of debugging an integrated circuit (IC) design, said method comprising:
- receiving a first IC design and a specification of an examination point for monitoring a particular location in the first IC design;
- converting, by using a computing device, the first IC design into a second IC design for implementation on an IC that comprises a plurality of configurable circuits, wherein the converting comprises producing the second IC design by removing a circuit element that determines a value at the particular location from the first IC design;
- identifying a set of observable locations in the IC according to the second IC design, wherein values at the set of observable locations determine values at the examination point in the first IC design;
- and
- tracking the values at the examination point of the first IC design by monitoring the set of observable locations in the IC.
A non-transitory machine readable medium storing a program that debugs an integrated circuit (IC) design, said program executable by a processor, the program comprising sets of instructions for:
- receiving a first IC design and a specification of an examination point for monitoring a particular location in the first IC design;
- converting the first IC design into a second IC design for implementation on an IC that comprises a plurality of configurable circuits, wherein the set of instructions for converting comprises a set of instructions for producing the second IC design by removing a circuit element that determines a value at the particular location from the first IC design;
- identifying a set of observable locations in the IC according to the second IC design, wherein values at the set of observable locations determine values at the examination point in the first IC design;
- and
- tracking the values at the examination point of the first IC design by monitoring the set of observable locations in the IC.
Dependencies are inferred from the claim text.