Loading patent…
AssigneeMentor Graphics Corporation
InventorsJames A. Culp, Paul Chang, Dureseti Chidambarrao, Praveen Elakkumanan, Jason Hibbeler, Anda C. Mocuta
Estimating the term…
Impact on parametric performance of physical design choices for transistors is scored for on-current and off-current of the transistors. The impact of the design parameters are incorporated into parameters that measure predicted shift in mean on-current and mean off-current and parameters that measure predicted increase in deviations in the distribution of on-current and the off-current. Statistics may be taken at a cell level, a block level, or a chip level to optimize a chip design in a design phase, or to predict changes in parametric yield during manufacturing or after a depressed parametric yield is observed. Further, parametric yield and current level may be predicted region by region and compared with observed thermal emission to pinpoint any anomaly region in a chip to facilitate detection and correction in any mistakes in chip design.
A system for analyzing parametric yield of a semiconductor chip design comprising:
A system for analyzing parametric yield of a semiconductor chip design comprising:
A system for analyzing parametric yield of a semiconductor chip design comprising:
A system for analyzing parametric yield of a semiconductor chip design comprising:
Dependencies are inferred from the claim text.