Memory storage device, memory controller thereof, and method thereof for generating log likelihood ratio
AssigneePhison Electronics Corp.
InventorsChien-Fu Tseng, Kuo-Hsin Lai
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AssigneePhison Electronics Corp.
InventorsChien-Fu Tseng, Kuo-Hsin Lai
Estimating the term…
A memory storage device, a memory controller, and a log likelihood ratio (LLR) generation method are provided. A read data corresponding to a first storage state is obtained from memory cells of a flash memory chip in the memory storage device by using bit data read voltages. An error checking and correcting procedure is performed on the read data to obtain a second storage state corresponding to the read data when the read data is written. An amount of storage error is obtained in storage states satisfying a statistic number, and a storage error means that data is in the second storage state when being written and is in the first storage state when being read. A logarithmic operation is executed according to the statistic number, an amount of the storage states, and the amount of storage error to generate a first LLR of the read data.
A log likelihood ratio (LLR) generation method, adaptable to a memory storage device, wherein the memory storage device comprises a flash memory chip having a plurality of memory cells, each of the memory cells has a plurality of storage states, and the storage states are distinguished by at least one bit data read voltage, the method comprising:
A memory controller, comprising:
A memory storage device, comprising:
Dependencies are inferred from the claim text.