System and method for alignment and inspection of ball grid array devices
AssigneeCognex Corporation
InventorsXiaoguang Wang, Lei Wang
Life of this patent
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Abstract
A system and method for high-speed alignment and inspection of components, such as BGA devices, having non-uniform features is provided. During training time of a machine vision system, a small subset of alignment significant blobs along with a quantum of geometric analysis for picking granularity is determined. Also, during training time, balls may be associated with groups, each of which may have its own set of parameters for inspection.
Claims17
A method for generating an alignment mask for a ball grid array device, the method comprising:
- extracting one or more blobs from a geometric model of the ball grid array device;
- identifying one or more alignment significant blobs;
- and
- generating the alignment mask using the one or more alignment significant blobs.
A system for generating an alignment mask for a ball grid array device, the system comprising:
- a geometric model of the ball grid array device;
- and
- a processor configured to
- (i) extract a set of gray scale blobs from the geometric model of the ball grid array device;
- (ii) identify a set of alignment significant blobs from the set of extracted gray scale blobs;
- and
- generate the alignment mask using at least one of the set of alignment significant blobs.
A method for inspecting a ball grid array device, the method comprising:
- capturing an image of the device;
- performing an alignment operation on the captured image to generate alignment information;
- extracting at least one of a plurality of balls from the image using the alignment information;
- and
- for each extracted ball, performing an inspection using a set of parameters associated with one group of a plurality of groups.
Dependencies are inferred from the claim text.