Method for performing an imaging examination technique
AssigneeSiemens Aktiengesellschaft
InventorStefan Assmann
Life of this patent
Estimating the term…
Abstract
A method is disclosed for performing an imaging examination technique. In at least one embodiment, the method includes measuring a first dataset via a first imaging examination technique, measuring a second dataset via a second imaging examination technique, segmenting the first dataset, transferring the segmentation to the second dataset, selecting at least one localization in the second dataset on the basis of the transferred segmentation, and measuring a third dataset via a third imaging examination technique such that the third dataset includes the at least one localization.
Claims22
A method for performing an imaging examination technique, comprising:
- measuring a first dataset via a first imaging examination technique;
- measuring a second dataset via a second imaging examination technique;
- segmenting the first dataset, the segmenting including,
- calculating a central line through a center of a vessel, and
- specifying at least one region around the central line such that the region contains the vessel, a diameter of the region being greater than a maximum vessel diameter;
- transferring the segmentation to the second dataset;
- selecting at least one localization in the second dataset based upon the transferred segmentation;
- and
- measuring a third dataset via a third imaging examination technique such that the third dataset includes the selected at least one localization.
A method for performing an imaging examination technique, comprising:
- measuring a first dataset via a first imaging examination technique;
- measuring a second dataset via a second imaging examination technique;
- segmenting the first dataset;
- transferring the segmentation to the second dataset;
- selecting at least one localization in the second dataset based upon the transferred segmentation, the at least one localization being visualized on a display medium together with the first data set and a user having an option to select one or more localizations for further investigation, wherein following the selection of the at least one localization, a list of parameters is generated for performing the third imaging measurement method, by which measurement log measurement data is recordable of a layer which contains the selected at least one localization and is oriented perpendicularly with respect to a nearby portion of the segmented first dataset;
- and
- measuring a third dataset via a third imaging examination technique such that the third dataset includes the selected at least one localization.
Dependencies are inferred from the claim text.