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US 8,427,170 B2Granted
Drive circuit array substrate and production and test methods thereof
AssigneeCasio Computer Co., Ltd.
InventorsKazunori Morimoto, Tsuyoshi Ozaki
Life of this patent
Estimating the term…
Abstract
A drive circuit array substrate allowing for tests without mounting any driver ICs and without using expensive panel contact jigs and production and test methods thereof are provided. A data voltage application circuit, data selection circuit, gate selection circuit, and anode driver connected to a display pixel forming zone are formed on a drive circuit array substrate. The data voltage application circuit, data selection circuit, gate selection circuit, and anode driver allows for lighting test and aging test of the light emitting elements in the display pixel forming zone and measurement of transistor characteristics without mounting any driver ICs and without using expensive panel contract jigs.
Claims10
A drive circuit array substrate comprising:
- a plurality of control signal wires formed on a substrate and extending in a first direction;
- a plurality of gradation signal wires formed on the substrate and extending in a second direction that is different from the first direction;
- a plurality of pixels formed on the substrate and arranged near intersections of the control signal wires and the gradation signal wires;
- and
- a drive element test circuit formed on the substrate,
- wherein each of the pixels includes a drive circuit, wherein the drive circuit includes a drive element and a selection element, wherein one end of a current path of the selection element is connected to one end of a current path of the drive element, and the other end of the current path of the selection element is connected to the gradation signal wire;
- wherein the drive element test circuit includes a plurality of test wires respectively connected to the gradation signal wires, a feeder wire to which an external circuit having a voltage source or a current source is connected, a plurality of read switches each having a current path connected to the test wire at one end and connected to the feeder wire at the other end, and a test wire selection circuit selecting the read switches in sequence;
- and
- wherein the feeder wire allows a current to run through the current path of the drive element from the external circuit via the selected read switch, the test wire, and the gradation signal wire when the feeder wire is connected to the external circuit.
6 more elements
A drive circuit array substrate comprising:
- a plurality of control signal wires formed on a substrate and extending in a first direction;
- a plurality of gradation signal wires formed on the substrate and extending in a second direction that is different from the first direction;
- a plurality of pixels formed on the substrate, each pixel having (i) a drive circuit having a drive element and a selection element, a current path of the selection element being connected to the gradation signal wire at one end and connected to a gate of the drive element at the other end, and (ii) a light emitting element which emits light when the drive element is driven, wherein the pixels are arranged near intersections between the control signal wires and the gradation signal wires;
- a drive element test circuit formed on the substrate;
- and
- a light emitting element test circuit formed on the substrate;
- wherein:
- the drive element test circuit includes a plurality of test wires respectively connected to a plurality of gradation signal wires, a feeder wire to which an external circuit having a voltage source or a current source is connected, a plurality of read switches each having a current path connected to the test wire at one end and connected to the feeder wire at the other end, and a test wire selection circuit selecting the read switches in sequence;
- the light emitting element test circuit has a plurality of first wires respectively connected to the gradation signal wires, a plurality of second wires connected to an external voltage source or connected to an external current source, a plurality of third wires connected to an external voltage source, and an output control switch a current path of which is connected to the first wire at one end and connected to the second wire at the other end;
- when the feeder wire is connected to the external circuit, a current is allowed to run through the current path of the drive element via the feeder wire, the selected read switch, the test wire, and the gradation signal wire;
- and
- when the second wire is connected to an external voltage source or connected to an external current source and the third wire is connected to an external voltage source, a current is allowed to run through the current path of the drive element via the second wire, the output control switch, the test wire, and the gradation signal wire so that the light emitting element emits light.
9 more elements
A method of testing a drive circuit array substrate, wherein the drive circuit array substrate comprises:
- a plurality of control signal wires formed on the substrate and extending in a first direction;
- a plurality of gradation signal wires formed on the substrate and extending in a second direction that is different from the first direction;
- a plurality of pixels formed on the substrate and arranged near intersections between the control signal wires and the gradation signal wires;
- and
- a drive element test circuit formed on the substrate,
- wherein each of the pixels has a drive circuit having a drive element and a selection element, a current path of the selection element being connected to one end of a current path of the drive element at one end and connected to the gradation signal wire at the other end;
- and
- wherein the drive element test circuit has a plurality of test wires respectively connected to the gradation signal wires, a feeder wire to which an external circuit having a voltage source or a current source and a voltmeter or an ammeter is connected, a plurality of read switches each having a current path connected to the test wire at one end and connected to the feeder wire at the other end, and a test wire selection circuit selecting the read switches in sequence;
- and
- wherein the method comprises:
- a step of running a current through the current path of the drive element via the feeder wire, the selected read switch, the test wire, and the gradation signal wire when the feeder wire is connected to the external circuit;
- and
- a drive test step of measuring element characteristics of the drive element either by supplying a voltage to the test wire and measuring the voltage value or by supplying a current to the test wire and measuring the voltage value so as to test the drive of the drive circuit.
10 more elements
Dependencies are inferred from the claim text.