US 8,411,822 B2 · Methods and systems for determining the average atomic number and mass of materials

Abstract

Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.

Claims40

Dependent claims

A method for analyzing material in a voxel of a target, the method comprising:

(a) illuminating the voxel of the target with a photon beam;
(b) measuring with at least one photon detector a first number of photons scattered from the voxel in a first predetermined energy range and in a first predetermined measurement direction;
(c) measuring with at least one photon detector a second number of photons scattered from the voxel in a second predetermined energy range and in a second predetermined measurement direction;
(d) determining in a processor a ratio of the first number of photons to the second number of photons;
(e) determining in a processor an average atomic number of the material in the voxel using the ratio;
(f) choosing at least one predetermined average atomic number range;
(g) based upon the average atomic number determined not being within any chosen predetermined average atomic number range, taking no further action with respect to the voxel;
and
(h) based upon the average atomic number determined being within a chosen predetermined average atomic number range, taking an action with respect to the voxel chosen from the group consisting of:
scanning the voxel at a higher resolution;
performing a NRF scan of the voxel;
scanning the voxel with another scanning method;
displaying in an output device an image of at least a part of the target to an operator;
and notifying the operator by means of an output device of a potential threat.

11 more elements

A method of scanning a target for potential threats, the method comprising:

(a) for each of a plurality of voxels in the target:
(i) illuminating the voxel with a photon beam;
(ii) measuring with at least one photon detector a first number of photons scattered from the voxel in a first predetermined energy range and in a first predetermined measurement direction;
(iii) measuring with at least one photon detector a second number of photons scattered from the voxel in a second predetermined energy range and in a second predetermined measurement direction;
(iv) determining in a processor a ratio of the first number of photons to the second number of photons;
(v) determining in a processor an average atomic number of material in the voxel using the ratio;
(b) choosing at least one predetermined average atomic number range;
(c) based upon the average atomic numbers determined not being within any chosen predetermined average atomic number range, taking no further action with respect to the target;
and
(d) based upon a predetermined number of the average atomic numbers determined being within a chosen predetermined average atomic number range, taking an action with respect to the target chosen from the group consisting of:
scanning at least one of the plurality of voxels at a higher resolution;
performing a NRF scan of at least one of the plurality of voxels;
scanning at least one of the plurality of voxels with another scanning method;
displaying in an output device an image of at least a part of the target to an operator;
and notifying the operator by means of an output device of a potential threat.

12 more elements

A system for analyzing material in a voxel of a target, the method comprising:

(a) a device for illuminating the voxel of the target with a photon beam;
(b) at least one photon detector configured to measure a first number of photons scattered from the voxel in a first predetermined energy range and in a first predetermined measurement direction;
(c) at least one photon detector configured to measure a second number of photons scattered from the voxel in a second predetermined energy range and in a second predetermined measurement direction;
(d) a processor configured:
(i) to determine a ratio of the first number of photons to the second number of photons;
(ii) to determine an average atomic number of the material in the voxel using the ratio;
(iii) based upon the average atomic number determined not being within a chosen predetermined average atomic number range, to determine to take no further action with respect to the voxel;
and
(iv) based upon the average atomic number determined being within the chosen predetermined average atomic number range, to determine to take an action with respect to the voxel chosen from the group consisting of:
scanning the voxel at a higher resolution;
performing a NRF scan of the voxel;
scanning the voxel with another scanning method;
instructing an output device to display an image of at least a part of the target to an operator;
and instructing the output device to notify the operator of a potential threat;
and
(e) an output device configured to:
(i) display an image of at least a part of the target to an operator;
and
(ii) notify the operator of a potential threat.

16 more elements

A system for scanning a target for potential threats, the method comprising:

(a) a device for illuminating a plurality of voxels in the target with a photon beam;
(b) at least one photon detector configured to measure a first number of photons scattered from each of the plurality of voxels in a first predetermined energy range and in a first predetermined measurement direction;
(c) at least one photon detector configured to measure a second number of photons scattered from each of the plurality of voxels in a second predetermined energy range and in a second predetermined measurement direction;
(d) a processor configured:
(i) to determine for each of the plurality of voxels a ratio of the first number of photons to the second number of photons;
(ii) to determine an average atomic number of the material in each of the plurality of voxels using the ratio;
(iii) based upon the average atomic numbers determined not being within a predetermined average atomic number range, to determine to take no further action with respect to the target;
and
(iv) based upon a predetermined number of the average atomic numbers determined being within the predetermined average atomic number range, to determine to take an action with respect to the target chosen from the group consisting of:
scanning at least one of the plurality of voxels at a higher resolution;
performing a NRF scan of at least one of the plurality of voxels;
scanning at least one of the plurality of voxels with another scanning method;
instructing an output device to display an image of at least a part of the target to an operator;
and instructing the output device to notify the operator of a potential threat;
and
(e) an output device configured to:
(i) display an image of at least a part of the target to an operator;
and
(ii) notify the operator of a potential threat.

16 more elements

A system of scanning a target for potential threats, the method comprising:

(a) a device for illuminating a plurality of voxels in the target with a photon beam;
(b) at least one photon detector configured to measure a first number of photons scattered from each of the plurality of voxels in a first predetermined energy range and in a first predetermined measurement direction;
(c) at least one photon detector configured to measure a second number of photons scattered from each of the plurality of voxels in a second predetermined energy range and in a second predetermined measurement direction;
(d) a processor configured:
(i) to determine for each of the plurality of voxels a ratio of the first number of photons to the second number of photons;
(ii) to determine an average atomic number of the material in each of the plurality of voxels using the ratio;
(iii) based upon the average atomic numbers determined not exceeding a predetermined average atomic number, to determine to take no further action with respect to the target;
and
(iv) based upon a predetermined number of the average atomic numbers determined exceeding a predetermined average atomic number, to determine to take an action with respect to the target chosen from the group consisting of:
scanning at least one of the plurality of voxels at a higher resolution;
performing a NRF scan of at least one of the plurality of voxels;
scanning at least one of the plurality of voxels with another scanning method;
instructing an output device to display an image of at least a part of the target to an operator;
and instructing the output device to notify the operator of a potential threat;
and
(e) an output device configured to:
(i) display an image of at least a part of the target to an operator;
and
(ii) notify the operator of a potential threat.

16 more elements

Dependencies are inferred from the claim text.

Methods and systems for determining the average atomic number and mass of materials

Life of this patent

Methods and systems for determining the average atomic number and mass of materials

Life of this patent

Abstract

Claims40