Method and a device for measuring the edge of optical lenses
AssigneeSchneider GmbH & Co. KG
InventorsGunter Schneider, Torsten Gerrath, Klaus Krämer
Life of this patent
Estimating the term…
Abstract
A method and an arrangement for determining the coordinates K of at least one point P1 on an edge of an optical lens, wherein the lens is held/can be positioned, by a retaining device, with the edge which is to be measured in an optical path of an optical micrometer, whereby the lens is held/can be positioned with the edge in the optical path, a coordinate Za is determined for the point P1, a variation of the relative position between the lens and the optical path is made, which is based on a pivotal axis S, a coordinate Zb is determined in the new position B for the point P1, and the coordinates Ya and Yb are determined.
Claims18
A method for determining the coordinates K of at least one point P1 on an edge of an optical lens, wherein the lens is retained by a retaining device having an axis of rotation R, with the edge extending in a circumferential direction to an axis of the optical lens and to the axis of rotation, the edge to be measured is held in an optical path of an optical micrometer which measures in the direction of a Z axis, the optical micrometer transmitting a linearly extending optical path of parallel light, with the optical path running in the direction of a Y axis, wherein the relative position between the retaining device and the micrometer is known, comprising the steps of:
- a) holding the lens with the edge to be measured in the optical path
- b) determining a first Z coordinate Za for the point P1 of the edge which is located in the optical path in a position A, wherein the point P1 represents a maximum or minimum value of the optical path, an X coordinate Xa of the point P1 corresponds to the X coordinate of the optical path
- c1) changing the relative position between the lens and the optical path by means of a pivoting movement around a pivotal axis S being inclined to the axis of rotation R, the point P1 being located in the optical path in a position B and representing a maximum or minimum value, or
- c2) the lens is hit by a second optical path which has a different relative position to the lens than the first optical path, wherein the first optical path is pivoted relative to the second optical path and that the point P1 represents a maximum or minimum value in the second optical path, and
- d) determining a second Z coordinate Zb for the point P1 of the edge which is located in the optical path, and
- e) determining on the basis of two equation systems for the point P1, for both relative positions, the missing coordinates Ya and Yb and thus the position of the point P1.
A measuring arrangement for measuring an edge of an optical lens, the edge extending in a circumferential direction to an axis of the optical lens, comprising:
- a retaining device for the lens and an optical micrometer which measures in the direction of a Z axis for generating an optical path which runs in the direction of a Y axis, the optical micrometer transmitting a linearly extending optical path of parallel light, within which the lens can be positioned, wherein the retaining device and the optical path can be rotated relative to each other around an axis of rotation R, the edge being adjustable in the circumferential direction to said axis of rotation R, wherein a pivotal axis S is provided by which the lens and the optical path can be pivoted relative to each other around an angle β, wherein the pivotal axis S comprises with the axis of rotation R an angle δ which is greater than 10° and less than 170°.
A measuring arrangement for measuring edges of an optical lens, and determining a first and a second Z coordinate Za, Zb for at least one point P1 of the edge, the edge extending in a circumferential direction to an axis of the optical lens, comprising:
- a retaining device for the lens and an optical micrometer which measures in the direction of a Z axis in order to generate an optical path which runs in the direction of a Y axis, the optical micrometer transmitting a linearly extending optical path of parallel light, within which the lens can be positioned, wherein the retaining device and the optical path can be rotated around an axis of rotation R relative to each other, the edge being adjustable in the circumferential direction to said axis of rotation R, wherein a second optical path which runs in the direction of an M axis is provided, within which the lens can be positioned, wherein between the M axis and the Y axis, an angle β is provided which is less than 90°, or the axis of rotation R runs parallel to a Z-Y level of the optical path at a distance xR, or the axis of rotation R comprises an angle ε with the Z-Y level which is greater than 0° and less than 20°.
A measuring arrangement according to claim to 16,
- wherein a further movement axis T is provided by means of which the lens and the optical path can be moved relative to each other in the direction of an X axis and at right-angles to the Y axis.
Dependencies are inferred from the claim text.