On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference

A surface wave assisted dark field device comprising:

• a layer having an aperture and a first surface, wherein a surface wave propagates along the first surface;
• and
• a corrugation in the first surface, the corrugation configured to provide a dark field by modifying the surface wave to increase destructive interference, wherein in the absence of an optical discontinuity at the aperture the modified surface wave destructively interferes with illumination being transmitted through the aperture.

A surface wave assisted optofluidic device comprising:

• a body comprising a fluid channel having a layer with at least one aperture and a first surface, wherein a surface wave propagates along the first surface;
• and
• a corrugation in the first surface, the corrugation configured to modify the surface wave to adjust an amount of illumination being transmitted through the at least one aperture, wherein the corrugation is configured to modify the surface wave to increase destructive interference.