Switch testing circuit
AssigneesHONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., Hon Hai Precision Industry Co., Ltd.
InventorYan Shi
Life of this patent
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Abstract
A switch testing circuit is configured for testing a switch. The switch testing circuit includes a switch element, a first light emitting diode, and a control chip. The first light emitting diode, the switch element, and the switch are connected in series. The first light emitting diode is configured for indicating connection condition between the switch and the switch testing circuit. The control chip is configured for acquiring a voltage from one terminal of the switch element and comparing the acquired voltage with a comparison voltage to judge whether the switch is qualified or disqualified according to the comparison result.
Claims10
A switch testing circuit configured for testing a switch, comprising:
- a switch element comprising a first terminal, a second terminal, and a control terminal for controlling the connection between the first terminal and the second terminal;
- wherein the second terminal of the switch element is connected to ground via the switch;
- a first light emitting diode comprising a cathode coupled to the first terminal of the switch element and an anode coupled to a power source, the first light emitting diode configured for indicating the connection condition between the switch and the switch testing circuit;
- and
- a control chip comprising a signal terminal coupled to the control terminal of the switch element and a detecting terminal coupled to one of the first terminal and the second terminal of the switch element;
- wherein when the switch testing circuit tests the switch, the control chip acquires a voltage of the first terminal of the switch element, compares the acquired voltage with a comparison voltage and determines whether the switch is qualified or disqualified according to the comparison.
A switch testing circuit configured for testing a switch, comprising:
- a switch element comprising a control terminal for controlling connection of the switch element;
- a first light emitting diode, wherein the first light emitting diode and the switch are connected in series with the switch element, and wherein the first light emitting diode and the switch form a loop with the switch element;
- and
- a control chip comprising a signal terminal coupled to the control terminal of the switch element and a detecting terminal coupled to the loop;
- wherein when the switch testing circuit tests the switch, the control chip acquires a voltage of the loop, compares the acquired voltage with a comparison voltage, and determines whether the switch is qualified or disqualified according to the comparison.
Dependencies are inferred from the claim text.