Non-contact component inspection system

An inspection system, comprising:

• an electromagnetic radiation source defining a source optical path, said electromagnetic radiation source being operable to cause electromagnetic radiation to propagate along said source optical path;
• a sensing device defining a sensor optical path;
• a system support structure, a base structure, a bridge structure, an electromagnetic radiation source mounting structure and a sensing device mounting structure;
• a positioning device including a positioning device stage, wherein said positioning device stage is movably disposed relative to said positioning device, said sensing device and said electromagnetic radiation source, and wherein said positioning device is non-movably disposed on said base structure;
• and
• a retention mount non-movably disposed on said positioning device stage, said retention mount being disposed within said sensor optical path such that when a component is retained within said retention mount, said component blocks at least a portion of said electromagnetic radiation to generate a silhouette, wherein said sensing device generates data responsive to said silhouette.