Methods of forming conductive contacts to source/drain regions and methods of forming local interconnects
AssigneeMicron Technology, Inc.
InventorsCem Basceri, Gurtej S. Sandhu, H. Montgomery Manning
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AssigneeMicron Technology, Inc.
InventorsCem Basceri, Gurtej S. Sandhu, H. Montgomery Manning
Estimating the term…
The invention comprises methods of forming a conductive contact to a source/drain region of a field effect transistor, and methods of forming local interconnects. In one implementation, a method of forming a conductive contact to a source/drain region of a field effect transistor includes providing gate dielectric material intermediate a transistor gate and a channel region of a field effect transistor. At least some of the gate dielectric material extends to be received over at least one source/drain region of the field effect transistor. The gate dielectric material received over the one source/drain region is exposed to conditions effective to change it from being electrically insulative to being electrically conductive and in conductive contact with the one source/drain region. Other aspects and implementations are contemplated.
A method of forming a local interconnect, comprising:
Dependencies are inferred from the claim text.