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US 8,408,066 B1Granted
High force vibration testing with wide frequency range
AssigneeSandia Corporation
InventorsEdward F. Romero, Richard A. Jepsen, Danny Lynn Gregory
Life of this patent
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Abstract
A shaker assembly for vibration testing includes first and second shakers, where the first shaker includes a piezo-electric material for generating vibration. A support structure permits a test object to be supported for vibration of the test object by both shakers. An input permits an external vibration controller to control vibration of the shakers.
Claims20
An apparatus for vibration testing, comprising:
- a shaker assembly including first and second shakers, said shaker assembly configured to support a test object thereon for vibration of the test object by both of said shakers, said first shaker including a piezo-electric material for generating vibration, and said second shaker rigidly fastened to said first shaker and configured to generate vibration without using piezo-electric material;
- and
- a control system coupled to said shakers for controlling vibration of the test object.
A shaker assembly for vibration testing, comprising:
- a first shaker, including a piezo-electric material for generating vibration;
- a second shaker rigidly fastened to said first shaker and configured to generate vibration without using piezo-electric material;
- a support structure configured to permit a test object to be supported for vibration of the test object by both of said shakers;
- and
- an input for permitting an external vibration controller to control vibration of said shakers.
2 more elements
Dependencies are inferred from the claim text.