Layout for multiple-fin SRAM cell
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsJhon Jhy Liaw, Jeng-Jung Shen
Life of this patent
Estimating the term…
Loading patent…
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsJhon Jhy Liaw, Jeng-Jung Shen
Estimating the term…
The present disclosure provides a static random access memory (SRAM) cell. The SRAM cell includes a plurality of fin active regions formed on a semiconductor substrate, wherein the plurality of fin active regions include a pair adjacent fin active regions having a first spacing and a fin active region having a second spacing from adjacent fin active regions, the second spacing being greater than the first spacing; a plurality of fin field-effect transistors (FinFETs) formed on the plurality of fin active regions, wherein the plurality of FinFETs are configured to a first and second inverters cross-coupled for data storage and at least one port for data access; a first contact disposed between the first and second the fin active regions, electrically contacting both of the first and second the fin active regions; and a second contact disposed on and electrically contacting the third fin active region.
A static random access memory (SRAM) cell comprising:
A semiconductor structure comprising:
Dependencies are inferred from the claim text.