Differential coat weight measurement by means of nuclear or X-ray gauges
AssigneeHoneywell ASCa Inc.
InventorsReena Meijer Drees, Gertjan Hofman
Life of this patent
Estimating the term…
Loading patent…
AssigneeHoneywell ASCa Inc.
InventorsReena Meijer Drees, Gertjan Hofman
Estimating the term…
An improved differential coat weight technique employs a novel algorithm for measuring the weight of a coating material that has been deposited onto a sheet of substrate. The invention employs dual x-ray or nuclear gauges such that, even though the downstream sensor is never exposed to uncoated sheet substrate, imparting the downstream sensor with the ability to predict results that it would have yielded when measuring the uncoated sheet substrate, leads to the development of a coat weight calibration protocol from which the basis weight of the coating can be ascertained directly from measurements from the upstream and downstream sensors. No subtraction of results is required. Moreover, the two sensors do not need to be re-calibrated whenever the relative proportions of the coating and base substrate change. The technique is particularly suited for applications where the coating material and substrate are made of substances that have very different atomic numbers.
A method of calibrating a coating sensor device for measuring the amount of coating material on a coated sheet substrate, such coating sensor device having (i) a first basis weight gauge that includes a first radiation source and first radiation detector with a first gap therebetween for directing a first radiation along a first path towards a sheet substrate and for detecting the amount of first radiation transmitted through the sheet substrate wherein the transmitted first radiation being a measure of the basis weight of the sheet substrate and (ii) a second basis weight gauge that includes a second radiation source and second radiation detector with a second gap therebetween for directing a second radiation along a second path towards the coated sheet substrate after the sheet substrate had been coated and for detecting the amount of second radiation transmitted through the coated sheet substrate wherein the transmitted second radiation being a measure of the basis weight of the coated sheet substrate, wherein the amount of coating material on the coated sheet substrate is determined by measurements from the first and second basis weight gauges, the method comprising the steps of:
A method of controlling the formation of a coated sheet substrate that is prepared by depositing a coating material on a coating apparatus that includes a continuous sheet of substrate that is moving in a downstream direction (MD) along a path wherein the coating material is deposited by a metering device that applies an amount of coating material on the continuous sheet of substrate, the method comprising the steps of
Dependencies are inferred from the claim text.