Optical scanning system having an extended programming mode and method of unlocking restricted extended classes of features and functionalities embodied therewithin
AssigneeMetrologic Instruments, Inc.
InventorsAnatoly Kotlarsky, Xiaoxun Zhu, Michael Veksland, Ka Man Au, Patrick Giordano, Weizhen Yan, Jie Ren, Taylor Smith, Michael V. Miraglia, C. Harry Knowles, Sudhin Mandal, Shawn De Foney, Christopher Allen, David M. Wilz, Sr.
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