Semiconductor device design support apparatus and semiconductor device design support method

A semiconductor device design support method executed on a computer, comprising:

• said computer receiving input of design information of a semiconductor device, setting an initial segment, wherein said segment is a group in which instances are grouped, determining a ΔVDD error rate, and obtaining an electrical current waveform for each instance;
• said computer repeating computation of an electrical current dispersion value which is with respect to said ΔVDD error rate, the dispersion value being desired to be less than a prescribed value based on an electrical current waveform for each of said instances, the prescribed value being decided based on said ΔVDD error rate, and division of said segment without changing width of lines that define said segment, if electrical current dispersion values of all segments set in said semiconductor device are equal to or greater than the prescribed value;
• said computer creating a macro-model for all of said segments;
• and
• said computer creating a substrate noise analysis netlist from said macro-model and a substrate netlist.

A semiconductor device design support apparatus, comprising:

• means for setting an initial segment in a layout of a semiconductor device and determining a ΔVDD error rate;
• means for obtaining dispersion of electrical current values which is with respect to the ΔVDD error rate, inside said segment from an electrical current waveform of an instance included in said initial segment,
• wherein said segment is a group in which instances are grouped;
• means for repeat dividing of said segment without changing width of lines that define said segment and computing of a dispersion value of said electrical current which is with respect to said ΔVDD error rate, the dispersion value being desired to be less than a prescribed value which is decided based on said ΔVDD error rate, if dispersion of said electrical current values is equal to or greater than the prescribed value;
• means for creating a macro-model for said divided segments at a stage at which dispersion of electrical current of all segments is less than said prescribed value;
• and
• means for creating a substrate noise analysis netlist from said macro-model and a substrate netlist.