Method and apparatus for measuring performance of hierarchical test equipment
AssigneeGlobalfoundries Inc.
InventorsEric O. Green, Morgan R. Bickle, Yeo-Ming Sk Koh
Life of this patent
Estimating the term…
Abstract
A method includes defining a hierarchy associated with a test system including a plurality of test units for testing integrated circuit devices. At least some of the test units have a plurality of sockets. The hierarchy includes a first level including a first plurality of entities each associated with one of the sockets and at least a second level including a second plurality of entities each associated with a grouping of the sockets. State data associated with operational states of the sockets is received. A set of state metrics is generated for each entity at each level of the hierarchy based on the state data. Each set of state metrics identifies time spent in the operational states.
Claims27
A method, comprising:
- defining a hierarchy associated with a test system including a plurality of test units for testing integrated circuit devices, at least some of the test units having a plurality of sockets, the hierarchy including a first level including a first plurality of entities each associated with one of the sockets and at least a second level including a second plurality of entities each associated with a grouping of the sockets;
- receiving state data associated with operational states of the sockets in a computing apparatus;
- and
- generating a set of state metrics in the computing apparatus for each entity at each level of the hierarchy based on the state data, each set of state metrics identifying time spent in the operational states.
A system, comprising:
- a plurality of test units for testing integrated circuit devices, at least some of the test units having a plurality of sockets, the sockets being organized in a hierarchy including a first level including a first plurality of entities each associated with one of the sockets and at least a second level including a second plurality of entities each associated with a grouping of the sockets;
- a performance monitor operable to receive state data associated with operational states of the sockets and generate a set of state metrics for each entity at each level of the hierarchy based on the state data, each set of state metrics identifying time spent in the operational states.
A system, comprising:
- means for defining a hierarchy associated with a test system including a plurality of test units for testing integrated circuit devices, at least some of the test units having a plurality of sockets, the hierarchy including a first level including a first plurality of entities each associated with one of the sockets and at least a second level including a second plurality of entities each associated with a grouping of the sockets;
- means for receiving state data associated with operational states of the sockets;
- and
- means for generating a set of state metrics for each entity at each level of the hierarchy based on the state data, each set of state metrics identifying time spent in the operational states.
Dependencies are inferred from the claim text.