System and method for measuring pin voltages of electronic components
AssigneeHon Hai Precision Industry Co., Ltd.
InventorsHsien-Chuan Liang, Shen-Chun Li, Wen-Laing Tseng, Yung-Chieh Chen, Shou-Kuo Hsu
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Abstract
A system and method uses a measurement control device and a measurement machine to measure pin voltages of electronic components installed in an electronic device. The measurement control device controls a mechanical arm of the measurement machine to move to the pins of the electronic components according to coordinates of the pins. A voltage probe installed on the end of the mechanical arm can measure voltages of the pins automatically.
Claims9
A method for measuring pin voltages of electronic components of an electronic device using a measurement control device and a measurement machine, the method comprising:
- (a) storing basic data of the electronic components into a database which communicates with the measurement control device, wherein the basic data comprises names and pin coordinates of the electronic components, and classifying the electronic components into a plurality of component types according to the names by the database;
- (b) sorting the basic data related to a component type selected from the plurality of component types with the measurement control device;
- (c) filtering the electronic components which belong to the selected component type with the measurement control device;
- (d) reading the pin coordinates of an electronic component selected from the filtered electronic components from the database with the measurement control device;
- (e) controlling a mechanical arm of the measurement machine to move to a pin of the selected electronic component according to the pin coordinates with the measurement control device;
- (f) controlling a voltage probe installed on the end of the mechanical arm to measure a voltage of the pin with the measurement control device;
- (g) repeating steps from (e) to (f) until all pins of the selected electronic component have been measured;
- and
- (h) generating test results including the voltages of the pins of the selected electronic component with the measurement control device, and outputting the test results to display on a display of the measurement control device.
A non-transitory storage medium having stored thereon instructions that, when executed by at least one processor of a computing device, cause the computing device to perform a method for measuring pin voltages of electronic components installed in an electronic device, the method comprising:
- (a) storing basic data of the electronic components into a database which communicates with the computing device, wherein the basic data comprises names and pin coordinates of the electronic components, and classifying the electronic components into a plurality of component types according to the names by the database;
- (b) sorting the basic data related to a component type selected from the plurality of component types with the computing device;
- (c) filtering the electronic components which belong to the selected component type with the computing device;
- (d) reading the pin coordinates of an electronic component selected from the filtered electronic components from the database with the computing device;
- (e) controlling a mechanical arm of a measurement machine to move to a pin of the selected electronic component according to the pin coordinates with the computing device;
- (f) controlling a voltage probe installed on the end of the mechanical arm to measure a voltage of the pin with the computing device;
- (g) repeating steps from (e) to (f) until all pins of the selected filtered electronic component have been measured;
- and
- (h) generating test results including the voltages of the pins of the selected electronic component, and outputting the test results to display on a display of the computing device.
A system for measuring pin voltages of electronic components installed in an electronic device, the system comprising:
- a measurement machine comprising a platform that places the electronic device, a mechanical arm, and a voltage probe installed on the end of the mechanical arm;
- and
- a database that stores basic data of the electronic components comprising names and pin coordinates, of the electronic components, and classifies the electronic components into a plurality of component types according to the names;
- a measurement control device communicating with the database and measurement machine, and comprising:
- a download module operable to sort the basic data related to a component type selected from the plurality of component types;
- a filtration module operable to filter the electronic components which belong to the selected component type;
- a reading module operable to read the pin coordinates of an electronic component selected from the filtered electronic components from the database;
- a movement control module operable to control the mechanical arm to move to the pins of the selected electronic component according to the pin coordinates;
- a measurement control module operable to control the voltage probe to measure voltages of the pins;
- and
- a test result generation module operable to generate test results including the voltages of the pins of the selected electronic component, and output the test results on a display of the measurement control device.
Dependencies are inferred from the claim text.