Analyte testing systems
AssigneeAbbott Diabetes Care Inc.
InventorsWilliam Matievich, Jr., Alexander G. Ghesquiere, Ting Chen
Life of this patent
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Abstract
The present invention includes analyte measurement systems, analyte measurement meters, analyte testing devices, cartridges thereof and integrated circuits for use therewith, and further includes methods related to the use of the integrated circuits and, in certain embodiments, to the counting or tracking of parameters related to the cartridges and analyte test devices.
Claims52
An analyte measurement system comprising:
- a meter;
- and
- one or more cartridges of analyte testing devices, each cartridge comprising an integrated circuit coupled thereto and having stored thereon information specific to the analyte testing devices within the cartridge, and wherein the meter is configured to communicate with the integrated circuit to access the information stored therein, and wherein the system is configured to track at least one analyte testing device degradation parameter;
- wherein the meter comprises a compartment therein for operatively receiving a cartridge therein and a mechanism for selectively maintaining a hermetic seal on the cartridge, wherein a degradation parameter comprises the cumulative time the cartridge is unsealed.
A cartridge for containing a plurality of analyte testing devices and for operably coupling to an analyte meter, the cartridge comprising:
- an integrated circuit coupled to the cartridge, the integrated circuit comprising at least one algorithm for tracking at least one analyte testing device degradation parameter;
- wherein the integrated circuit is configured to communicate with an analyte measurement meter that operatively receives the cartridge therein and that includes a mechanism for selectively maintaining a hermetic seal on the cartridge;
- wherein the cartridge is hermetically resealable, and wherein the at least one analyte testing device degradation parameter comprises the cumulative time the cartridge is unsealed between resealings.
A method of tracking at least one degradation parameter for analyte testing devices dispensable from within a sealed cartridge having an integrated circuit coupled thereto and installable within an analyte measurement meter communicable therewith, the method, upon installation of the cartridge within the meter, comprising:
- communicating with the integrated circuit and accessing the at least one degradation parameter;
- and
- updating the at least one degradation parameter based on at least one type of action performed by the meter;
- wherein the updating comprises summing at least two degradation parameters.
The method of 40, wherein:
- a first degradation parameter comprises cumulative time the analyte testing devices are exposed to ambient air;
- and
- a first type of action comprises temporarily unsealing the cartridge.
The method of 41, wherein:
- a second degradation parameter comprises cumulative time the analyte testing devices are exposed to desiccated conditions, wherein the cartridge comprises a desiccating material;
- and
- a second type of action comprises receiving the cartridge in the meter.
A method of analyte testing calibration for a lot of analyte testing devices contained within a cartridge configured for installation into an analyte testing meter, the method comprising:
- storing information specific to the lot of analyte testing devices onto an integrated circuit associated with the cartridge, the information including a cartridge identifier;
- installing the cartridge into the meter, wherein the meter is in communication with the integrated circuit;
- storing the cartridge identifier onto the meter from the integrated circuit;
- calibrating the meter for using the analyte testing devices associated with the cartridge identifier;
- and
- tracking at least one analyte testing device degradation parameter, wherein the meter comprises a compartment therein for operatively receiving the cartridge therein and a mechanism for selectively maintaining a hermetic seal on the cartridge, and wherein the degradation parameter comprises the cumulative time the cartridge is unsealed.
Dependencies are inferred from the claim text.