Optimized scheduling based on sensitivity data
AssigneeInternational Business Machines Corporation
InventorsBrian T. Denton, Cuc K Huynh, Shreesh S. Tandel, Steven H. Voldman
Life of this patent
Estimating the term…
Abstract
A scheduling optimizer system, method and program product that analyzes a device for sensitivities, such as ESD sensitivities, and allows for modification of a floor schedule of the assembly unit of the device based on the sensitivity of the device while improving the overall performance of the assembly unit are disclosed. The scheduling optimizer analyzes sensitivity data for a device during operation of the assembly unit on the floor schedule. The floor schedule is then optimized based on the analyzed sensitivity data.
Claims34
A method comprising the steps of:
- a. providing a floor schedule of an assembly unit for a device;
- b. optimizing the floor schedule based on sensitivity data of the device during operation of the assembly unit on the floor schedule;
- and
- c. receiving the sensitivity data and optimizing the floor schedule in real-time.
A computer program product comprising a non-transitory computer readable medium having computer readable program code embodied therein for optimizing a floor schedule of an assembly unit for a device, the program product comprising:
- program code configured to analyze sensitivity data for the device during operation of the assembly unit on the floor schedule;
- and
- program code configured to optimize the floor schedule of the assembly unit based on the sensitivity data.
An optimizer system comprising:
- a model analyzer for receiving sensitivity data for a device of an assembly unit, and analyzing the sensitivity data during operation of the assembly unit on a floor schedule;
- and
- a scheduling optimizer for optimizing the floor schedule of the assembly unit based on the analyzed sensitivity data.
A method comprising the steps of:
- generating sensitivity data for a device of an assembly unit during operation of the assembly unit on a floor schedule;
- and
- receiving an optimal path data of the floor schedule that is generated based on the sensitivity data,
- wherein the optimal path data controls the path of the device through the assembly unit.
A testing unit comprising:
- a sensitivity monitor for generating sensitivity data for a device;
- a reliability generator for generating reliability data having rules for the device;
- and
- a tool controller for invoking the sensitivity monitor and reliability generator and shutting down a testing tool of the testing unit.
Dependencies are inferred from the claim text.