Temperature detection circuit of semiconductor memory apparatus
AssigneeHynix Semiconductor Inc.
InventorsJe-Yoon Kim, Jong-Chern Lee
Life of this patent
Estimating the term…
Abstract
A temperature detection circuit of a semiconductor memory apparatus includes a fixed period oscillator, a temperature variable signal generating unit and a counting unit. The oscillator is configured to generate a fixed period oscillator signal when an enable signal is enabled. The temperature variable signal generating unit is configured to generate a temperature variable signal whose enable interval varies based on temperature variations, when the enable signal is enabled. The counting unit is configured to count the oscillator signal during the enable interval of the temperature variable signal to generate a temperature information signal.
Claims12
A temperature detection circuit of a semiconductor memory apparatus comprising:
- a fixed period oscillator configured to generate an oscillator signal when an enable signal having a fixed period is enabled;
- a temperature variable signal generating unit configured to generate a temperature variable signal whose enable interval varies based on temperature variations, when the enable signal is enabled;
- and
- a counting unit configured to count the oscillator signal during the enable interval of the temperature variable signal to generate a temperature information signal, wherein the counting unit counts the oscillator signal during the interval where the temperature variable signal is enabled.
Dependencies are inferred from the claim text.