Multi-bit phase alignment for synchronization mark pattern matching
AssigneeHGST Netherlands B.V.
InventorsRichard Leo Galbraith, Weldon Mark Hanson, Travis Roger Oenning, Todd Carter Truax
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AssigneeHGST Netherlands B.V.
InventorsRichard Leo Galbraith, Weldon Mark Hanson, Travis Roger Oenning, Todd Carter Truax
Estimating the term…
Embodiments of the present invention relate to the detection of synchronization marks in data storage and retrieval. To detect a synchronization mark, embodiments of the present invention require both pattern matching and proper phase alignment, following a repeating synchronization field. According to one particular embodiment, proper phase alignment following a repeated four bit synchronization field, is utilized in conjunction with pattern matching, to identify a synchronization mark. By allowing a synchronization mark to be identified only with proper phase alignment at the earliest possible occurrence of the synchronization mark, accuracy of synchronization mark detection may be improved.
A method of detecting a synchronization mark, the method comprising:
An apparatus for detecting a synchronization mark, the apparatus comprising:
An apparatus for detecting a synchronization mark, the apparatus comprising:
Dependencies are inferred from the claim text.