System and method to determine chromatic dispersion in short lengths of waveguides using a 3-wave interference pattern and a single-arm interferometer

An interferometric method for obtaining a measure of the chromatic dispersion of a waveguide comprising the steps of:

• a. connecting a radiation source to a means for separating incident and reflected waves, said means for separating incident and reflected waves having an output arm terminating at a connector;
• b. placing a first facet of the waveguide adjacent to the connector;
• c. connecting the means for separating incident and reflected waves to a detector;
• d. placing a collimating lens at a second facet of the waveguide;
• e. positioning a reflecting means at a balanced distance from the collimating lens;
• f. generating a radiation emission from the radiation source;
• g. recording an interferogram consisting of three waves with the detector wherein the first wave is a reflection of the radiation emission from the first facet of the waveguide, the second wave is a reflection of the radiation emission from the second facet of the waveguide, and the third wave is a reflection of the radiation emission from the reflecting means;
• and
• h. measuring dispersion parameters from the recorded interferogram.

An interferometric method for obtaining a measure of the chromatic dispersion of an external waveguide to a modular interferometer comprising the steps of:

• a. generating a modular interferometer including:
• i. a first input operable to connect an external radiation source to an internal means for separating incident and reflected waves;
• ii. a second input operable to connect an external detector to the internal means for separating incident and reflected waves;
• iii. a duo-input wherein a third input is operable to connect a first facet of the waveguide to the internal means for separating incident and reflected waves and wherein a fourth input is operable to place a second facet of the waveguide in close proximity to an internal collimating means wherein an internal reflecting means is positioned at a distance to said internal collimating means;
• b. connecting a first facet of the waveguide to the third input;
• c. connecting a second facet of the waveguide to the fourth input;
• d. generating a radiation emission from the external radiation source;
• e. recording an interferogram consisting of three waves with the external detector wherein a first wave is a reflection of the radiation emission from the first facet of the waveguide, a second wave is a reflection of the radiation emission from the second facet of the waveguide, and a third wave is a reflection of the radiation emission from the reflecting means;
• and
• f. measuring dispersion parameters from the recorded interferogram.