Test apparatus and test method
AssigneeAdvantest Corporation
InventorsToshiyuki Kiyokawa, Toshikazu Okawa
Life of this patent
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AssigneeAdvantest Corporation
InventorsToshiyuki Kiyokawa, Toshikazu Okawa
Estimating the term…
A test apparatus comprising a plurality of test units that test a device under test; a plurality of housing sections that respectively house the test units therein; a plurality of opening/closing sections that are disposed respectively in the housing sections and that expose the test units to the outside or isolate the test units from the outside; and a control section that independently controls whether each of the opening/closing sections is allowed to be opened. The control section may allow test units that are not supplied with power to be exposed to the outside. For at least one of (i) a period during which one of the test units is performing a predetermined operation, (ii) a predetermined period before the period during which one of the test units is performing the predetermined operation, and (iii) a predetermined period after the period during which one of the test units is performing the predetermined operation, the control section may prohibit other test units from being exposed to the outside.
A test apparatus comprising:
A test apparatus comprising:
A test apparatus comprising:
A test method comprising:
Dependencies are inferred from the claim text.