A device for inspecting a magnetic head, for inspecting properties of a slender rectangular plate-like magnetic head, that is, a row bar-shaped magnetic head, cut from a wafer, comprising:
- a magnetic head transporting mechanism, for receiving the row bar-shaped magnetic head from a tray mechanism vertically installed in a manner that a long edge of a rectangle of a section, cut-out vertically to a length direction, of the row bar-shaped magnetic head is vertical to a horizontal line, converting a posture of the row bar-shaped magnetic head into a horizontal installation state installed in a manner that the long edge is parallel to the horizontal line, and transporting, to be in a horizontal installation state, the row bar-shaped magnetic head in the horizontal installation state to a carrying portion of an inspection stage.