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US 8,299,507 B2Granted
Semiconductor device
AssigneeKabushiki Kaisha Toshiba
InventorsTatsuo Shimizu, Atsuhiro Kinoshita
Life of this patent
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Abstract
It is made possible to optimize the effective work function of the metal for a junction and suppress the resistance as far as possible at the interface between a semiconductor or a dielectric material and a metal. A semiconductor device includes: a semiconductor film; a Ti oxide film formed on the semiconductor film, and including at least one element selected from the group consisting of V, Cr, Mn, Fe, Co, Ni, Nb, Mo, Tc, Ru, Rh, Pd, Ta, W, Re, Os, Ir, and Pt; and a metal film formed on the Ti oxide film.
Claims17
A semiconductor device, comprising:
- a semiconductor film;
- a semiconductor source region and a semiconductor drain region formed at a distance from each other in the semiconductor film, and having a different conductivity type from the semiconductor film;
- a gate insulating film formed on a portion of the semiconductor film, the portion being located between the semiconductor source region and the semiconductor drain region;
- a gate electrode formed on the gate insulating film;
- a first and second Ti oxide films formed on the semiconductor source region and the semiconductor drain region respectively, and including at least one element selected from the group consisting of V, Cr, Mn, Fe, Co, Ni, Nb, Mo, Tc, Ru, Rh, Pd, Ta, W, Re, Os, Ir, and Pt;
- and
- a metal source and metal drain electrodes formed on the first and second Ti oxide films respectively.
4 more elements
A semiconductor device, comprising:
- a semiconductor film;
- a metal source region and a metal drain region formed at a distance from each other in the semiconductor film;
- a gate insulating film formed on a portion of the semiconductor film, the portion being located between the metal source region and the metal drain region;
- a gate electrode formed on the gate insulating film;
- a first Ti oxide film formed between the portion and the metal source region, and including at least one element selected from the group consisting of V, Cr, Mn, Fe, Co, Ni, Nb, Mo, Tc, Ru, Rh, Pd, Ta, W, Re, Os, Ir, and Pt;
- and
- a second Ti oxide film formed between the portion and the metal drain region, and including at least one element selected from the group consisting of V, Cr, Mn, Fe, Co, Ni, Nb, Mo, Tc, Ru, Rh, Pd, Ta, W, Re, Os, Ir, and Pt.
4 more elements
A semiconductor device comprising:
- a semiconductor film;
- a Ti oxide film formed on the semiconductor film, and including at least one element selected from the group consisting of V, Cr, Mn, Fe, Co, Ni, Nb, Mo, Tc, Ru, Rh, Pd, Ta, W, Re, Os, Ir, and Pt, the element existing in the Ti oxide film by substituting Ti in the Ti oxide film;
- and
- a metal film formed on the Ti oxide film, wherein
- the element included in the Ti oxide film is Nb, Ta, or W,
- the semiconductor film is formed with an n-type semiconductor, and
- at least one element selected from the group consisting of N, C, B, Mg, Ca, Sr, Ba, Al, Sc, Y, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, and Lu is further included in the Ti oxide film.
4 more elements
A semiconductor device comprising:
- a semiconductor film;
- a Ti oxide film formed on the semiconductor film, and including at least one element selected from the group consisting of V, Cr, Mn, Fe, Co, Ni, Nb, Mo, Tc, Ru, Rh, Pd, Ta, W, Re, Os, Ir, and Pt, the element existing in the Ti oxide film by substituting Ti in the Ti oxide film;
- and
- a metal film formed on the Ti oxide film, wherein
- the element included in the Ti oxide film is an element selected from the group consisting of V, Cr, Mn, Fe, Co, Ni, Mo, Tc, Ru, Rh, Pd, Re, Os, Ir, and Pt,
- at least one element selected from the group consisting of F, H, and Ta is further included in the Ti oxide film, and
- the semiconductor film is formed with an n-type semiconductor.
4 more elements
A semiconductor device comprising:
- a semiconductor film;
- a Ti oxide film formed on the semiconductor film, and including at least one element selected from the group consisting of V, Cr, Mn, Fe, Co, Ni, Nb, Mo, Tc, Ru, Rh, Pd, Ta, W, Re, Os, Ir, and Pt, the element existing in the Ti oxide film by substituting Ti in the Ti oxide film;
- and
- a metal film formed on the Ti oxide film, wherein
- the element included in the Ti oxide film is an element selected from the group consisting of Ta, Nb, W, and Mo,
- at least one element selected from the group consisting of N, C, B, Mg, Ca, Sr, Ba, Al, Sc, Y, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, and Lu is further included in the Ti oxide film, and
- the semiconductor film is formed with a p-type semiconductor.
4 more elements
A semiconductor device comprising:
- a semiconductor film;
- a Ti oxide film formed on the semiconductor film, and including at least one element selected from the group consisting of V, Cr, Mn, Fe, Co, Ni, Nb, Mo, Tc, Ru, Rh, Pd, Ta, W, Re, Os, Ir, and Pt, the element existing in the Ti oxide film by substituting Ti in the Ti oxide film;
- and
- a metal film formed on the Ti oxide film, wherein
- the element included in the Ti oxide film is an element selected from the group consisting of V, Cr, Mn, Fe, Co, Ni, Tc, Ru, Rh, Pd, Re, Os, Ir, and Pt,
- the semiconductor film is formed with a p-type semiconductor, and
- at least one element selected from the group consisting of F, H, and Ta is further included in the Ti oxide films.
4 more elements
A semiconductor device, comprising:
- a semiconductor film;
- a Ti oxide film formed on the semiconductor film, and including at least one element selected from the group consisting of V, Cr, Mn, Fe, Ni, Nb, Mo, Tc, Ru, Rh, Pd, Ta, W, Re, Os, Ir, and Pt;
- and
- a metal film formed on the Ti oxide film.
1 more element
Dependencies are inferred from the claim text.