US 8,286,042 B2Granted

On-chip seed generation using boolean functions for LFSR re-seeding based logic BIST techniques for low cost field testability

AssigneeTexas Instruments Incorporated

InventorsSwathi Gangasani, Srinivasulu Alampally, Divya Divakaran, Rubin Ajit Parekhji, Amit Kumar Dutta, Srivaths Ravi

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Abstract

This invention generates the random seed patterns using simple, low-area overhead digital circuitry on-chip. This circuit is implemented as a finite state machine whose states are the seeds as contrasted to storing the seeds in the prior art. These seeds are used to control pseudo-random pattern generation for built-in self-tests. This invention provides a large reduction in chip area in comparison with storing seeds on-chip or off-chip.

Claims13

Dependent claims

A built-in self-test system for field testing an electronic circuit, comprising:

a shadow register storing a seed;
a pseudo-random pattern generator connected to said shadow register to receive said seed and generating a new unique pattern each cycle of a built-in self-test clock;
a phase shifter connected to said pseudo-random pattern generator to receive each generated unique pattern converting a one-dimensional stream of said pseudo-random patterns into a two dimensional array of values;
a circuit under test including operational circuits having plural data registers and a plurality of scan chains, each scan chain connecting some of said plural data registers within said operational circuits in a serial chain from a corresponding input to a corresponding output when in a scan test mode, each of said inputs of said plurality of scan chains connected to said phase shifter to receive a corresponding array of values;
a test data compactor connected to said outputs of each of said plurality of scan chains of said circuit under test to receive data from said plural data registers, said test data compactor compacting said data;
a multiple-input signature register connected to said test data compactor for storing said compacted data for comparison with an expected internal state;
seed generation logic connected to said shadow register for supplying a plurality of seeds to said shadow register, said seed generation logic including a finite state machine and generating a next seed from a tied seed and a count of a number of seeds generated;
and
a built-in self-test controller operable for each seed of a plurality of seeds to
place said circuit under test into said test mode,
control said shadow register to transfer a seed to said pseudo-random pattern generator to cause said phase shifter to transfer said two dimensional array of values to said circuit under test,
place said circuit under test in a normal mode and operate for a predetermined interval,
place said circuit under test in said test mode and transfer data stored in said data registers out of said circuit under test to said test data compacter,
store said compacted data in said multiple-input signature register,
compare said stored compacted data to said expected internal standard;
and
said built-in self-test controller is further operable to control said seed generation logic to generate said next seed of a predetermined plurality of seeds.

14 more elements

Dependencies are inferred from the claim text.

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Abstract

A built-in self-test system for field testing an electronic circuit, comprising:

a shadow register storing a seed;
a pseudo-random pattern generator connected to said shadow register to receive said seed and generating a new unique pattern each cycle of a built-in self-test clock;
a phase shifter connected to said pseudo-random pattern generator to receive each generated unique pattern converting a one-dimensional stream of said pseudo-random patterns into a two dimensional array of values;
a circuit under test including operational circuits having plural data registers and a plurality of scan chains, each scan chain connecting some of said plural data registers within said operational circuits in a serial chain from a corresponding input to a corresponding output when in a scan test mode, each of said inputs of said plurality of scan chains connected to said phase shifter to receive a corresponding array of values;
a test data compactor connected to said outputs of each of said plurality of scan chains of said circuit under test to receive data from said plural data registers, said test data compactor compacting said data;
a multiple-input signature register connected to said test data compactor for storing said compacted data for comparison with an expected internal state;
seed generation logic connected to said shadow register for supplying a plurality of seeds to said shadow register, said seed generation logic including a finite state machine and generating a next seed from a tied seed and a count of a number of seeds generated;
and
a built-in self-test controller operable for each seed of a plurality of seeds to
place said circuit under test into said test mode,
control said shadow register to transfer a seed to said pseudo-random pattern generator to cause said phase shifter to transfer said two dimensional array of values to said circuit under test,
place said circuit under test in a normal mode and operate for a predetermined interval,
place said circuit under test in said test mode and transfer data stored in said data registers out of said circuit under test to said test data compacter,
store said compacted data in said multiple-input signature register,
compare said stored compacted data to said expected internal standard;
and
said built-in self-test controller is further operable to control said seed generation logic to generate said next seed of a predetermined plurality of seeds.

14 more elements