Inspection apparatus and inspection method
AssigneePanasonic Corporation
InventorsTakashi Iwahashi, Toshihiko Tsujikawa, Atsushi Katayama
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AssigneePanasonic Corporation
InventorsTakashi Iwahashi, Toshihiko Tsujikawa, Atsushi Katayama
Estimating the term…
Aims to provide an inspection apparatus which precisely detects an amount of misalignment of a component mounted on a panel through an adhesive which contains conductive particles. The inspection apparatus includes: an infrared-light illuminator (305) which is provided on a bottom-surface side of the panel and illuminates with light a panel recognition mark formed on the panel and a component recognition mark formed on the component; an IR camera (307) which is provided opposite to the illuminator (305) and captures images of the light-illuminated recognition marks; and an amount-of-misalignment calculation unit (446) which calculates, using the images captured by the camera (307), an amount of misalignment of the recognition marks as an amount of misalignment in mounting position, wherein the illuminator (305) emits light in an amount which causes halation, the light having a wavelength that allows the light to pass through the panel and the component but does not allow or does not easily allow the light to pass through the conductive particles.
An inspection apparatus which detects an amount of misalignment, from a predetermined mounting position, of a component mounted on a surface of a panel through an adhesive which contains conductive particles, said inspection apparatus comprising:
An inspection method for detecting an amount of misalignment, from a predetermined mounting position, of a component mounted on a surface of a panel through an adhesive which contains conductive particles, said inspection method comprising:
Dependencies are inferred from the claim text.